Energy Dispersive Spectroscopy
Energy Dispersive Spectroscopy (EDS) is an analytical technique used for the analysis and characterization of a sample.
Elemental composition analysis is key to understanding foreign materials, coating composition, small component materials, rapid alloy identify, evaluating corrosion, plus phase identification and distribution.
EDS systems from EDAX provide qualitative and quantitative insight dedicated to your choice of application.
APEX™ is EDAX's premier software program for the collection and analysis of Energy Dispersive Spectroscopy (EDS) data and the compositional characterization of materials. APEX ensures high-quality, accurate results and increased productivity with its easy to use interface, live-time graphical display, and simultaneous review mode analysis. Read more..
The most intuitive and easy-to-use analytical tool for (scanning) transmission electron microscope (STEM) applications.
The Element Energy Dispersive Spectroscopy (EDS) System delivers powerful analytical capability in a compact package, maximizing performance and flexibility, while providing streamlined operation to guarantee fast results and ease of use. It is focused on the industrial market, where application specific problems need to be solved quickly and accurately. The combination of an Element Silicon Drift Detector (SDD) with the user friendly APEX™ software provides a complete EDS microanalysis solution for all levels of analysis and high throughput industrial applications.
The Octane Elect EDS System is an enhanced Energy Dispersive Spectroscopy (EDS) platform with the latest advancements in Silicon Drift Detector (SDD) technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at an optimal value with a remarkable low energy sensitivity for light element detection and low voltage (kV) microanalysis.
The game changing advancements in the Octane Elite SDDs take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite EDS System also uses state of the art electronics, which yield high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.